Wheat production is essential for global food security, and continual improvement to grain yield is necessary to meet the nutritional demands of the expanding human population. Grain size is positively correlated with grain weight, while the flag leaf serves as the major source of photosynthetic assimilates for grain development, therefore grain and flag leaf morphologies are determining factors in the final yield potential of wheat. Identification of genes involved in both grain and flag leaf morphologies remains an essential step in precision breeding and cultivation of wheat with high yield potential.
